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In this book, atomic force microscopy (AFM) tip profile was introduced and studied on carbon nanotube with various widths. This technique is a potential applicant for imaging the bodies at Nano-scale under 10 nm due to the sharp apex of AFM’s tips. In addition, it could apply for biology samples such as DNA, proteins, cells, which have larger sizes and higher sensitive surfaces. Therefore, AFM tip shapes have been emerged and studied throughout. The image information has been analyzed to estimate the AFM tip profile. The image analysis has been characterized by many programs specifically Surface program and Matlab. The purpose of our work is to present specific methods of investigation AFM tips on 2 nm – 10 nm carbon nanotube diameters.
Chapter 1: Introduction |
Chapter 2: AFM and Tip Geometries 2.1. Atomic Force Microscopy (AFM) 2.1.1. Principles 2.1.2. How the System Operates 2.1.3. Advantages and Drawbacks 2.2. Tip Manufacturing 2.2.1. Top Down Manufacturing 2.2.2. Bottom Up Manufacturing 2.3. Examining Tip Structures 2.4. Calculation and Surface Program |
Chapter 3: Visualizing the Nano-World 3.1. Microscopy 3.1.1. Atomic Force Microscopy (AFM) 3.1.2. Scanning Electron Microscopy 3.2. Electron Beam Lithography (EBL) 3.3. Ultra-High Vacuum (UHV). |
Chapter 4: Techniques in Nanotechnology 4.1. Silicon Chip Preparation 4.2. Resists 4.3 Electron Beam Patterning 4.4. Development and Metal Evaporation 4.5. Deposited Carbon Nanotubes 4.6. Imaging by AFM 4.7. Imaging by e-LINE |
Chapter 5: The Tip and the Tube 5.1. Estimated Diameters for CNTs 5.2. Estimating the Radius for AFM Tip |
Chapter 6: Conclusions |
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